Kantech KT-SG-MT2 Multi-Technology Smart Card Reader, Single Gang, 13.56 MHz + 125 kHz

Streamline and secure access control upgrades with the Kantech KT-SG-MT2 Multi-Technology Smart Card Reader. This single-gang ioSmart reader enables a smooth migration from legacy prox cards to advanced MIFARE Plus smart credentials while maintaining day-to-day operations. Built for enterprise security, the reader delivers AES 128-bit end-to-end encryption (when used with KT-400 or KT-1 controllers) and supports both 13.56 MHz and 125 kHz card formats so you can support mixed fleets of credentials without replacing all cards at once.

Designed for integrators and facility managers, the KT-SG-MT2 offers RS-485 and Wiegand host interfaces for effortless integration with access control panels, monitoring systems and surveillance platforms. The compact single-gang form factor, indoor/outdoor rating and option to wire directly to door contacts or T.Rex devices reduce installation time and cabling costs. Bluetooth-ready hardware and optional capacitive keypad add flexibility for future enhancements.

Ideal for corporate offices, healthcare, education and retail deployments needing robust security, simplified migration and lower total cost of ownership. Upgrade your access control and security monitoring—contact your reseller or add the Kantech KT-SG-MT2 to your solution today.

• Secure migration from prox to smart credentials with AES-128 end-to-end encryption, protecting card data and reducing fraud risk
• Multi-technology support (13.56 MHz MIFARE Plus + 125 kHz prox) lets you phase upgrades on your schedule
• RS-485 and Wiegand interfaces ensure seamless integration with existing access control systems and monitoring platforms
• Single-gang, indoor/outdoor design and direct wiring to door contacts/T.Rex save installation time and lower labor costs
• Bluetooth-ready and capacitive keypad options provide future-proof flexibility for evolving security needs
• Lifetime limited warranty and proven Kantech/Johnson Controls reliability for long-term system dependability